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SIMS Laboratory of Solid State Electronics Section from Electrical Engineering Department performs different analytical studies of semiconductors and various solid materials by secondary Ion Mass Spectrometry Technique (SIMS). We exploit a CAMECA IMS-6F Ion Microprobe equipped with a cesium ion gun and duoplasmatron ion sources. In this page you will be able to find a short description of anaytic technique, spectrometer characteristics, auxiliar instruments, work team, reports and a service section in order to allow you know the dimension of our lab.